Wysoka Brama Konfiguracja elektroniczny Uniwersalny Testing Machine, Nieniszczące Testowanie sprzętu

High Configuration Gate Electronic Universal Testing Machine, Non Destructive Testing Equipment MDW-E Microcomputer control Electronic Universal Testing Machine(High Configuration Gate type) Description: Series MDW-E Microcomputer control electronic universal testing machine is applicable for tensile tests of material like rubber, plastic, textile, waterproofing material, cable, network wire, metal wire, metal rod, metal plate and others. With attaching tools, it can also do